The Scanning Probe Image Processor, SPIP 3.0

The Scanning Probe Image Processor (SPIP) is a specialized desktop application for processing and analyzing data from scanning probe microscopy techniques such as AFM and STM. Built for nanoscience and surface metrology, it helps researchers and engineers clean, quantify, and visualize nanoscale surfaces with precision.

Key capabilities include:

• Broad file import support for common SPM instruments
• Artifact correction (plane leveling, line-by-line and drift correction), filtering, and denoising
• Quantitative surface analysis (roughness and texture parameters, step height, cross‑sections, particle/grain analysis, Fourier/PSD tools)
• Tip characterization and deconvolution to improve measurement fidelity
• High-quality 2D/3D visualization, measurement tools, and report generation
• Automation and batch processing for repeatable workflows

SPIP is widely used in materials science, semiconductors, nanotechnology, and related fields to turn raw SPM data into reliable, publication- and QA-ready results.

The Scanning Probe Image Processor, SPIP is developed by Image Metrology A/S. The most popular version of this product among our users is 3.0. The name of the program executable file is SPIP.exe.

You can check FastStone Image Viewer, Image Tuner, Image Comparer and other related programs like Boxoft Batch Photo Processor at the "download" section.